Standard Manual Prober HMP-800(8inch) / HMP-1200(12inch)
Standard Manual Prober Model
Standard Manual Prober HMP-800 / 1200
This is a standard manual prober that supports 8 inch or 12 inch wafers.
This prober supports reliable on-wafer measurements with a simple yet high-accuracy mechanism that is easy to operate.
This standard manual prober model is scalable to support a wide range of applications such as hot chuck systems (from room temperature to +200°C or +300°C), submicron resolution stages, and laser cutters.
HiSOL, Inc. is a solution partner company of Keysight Technologies, Inc.
Model with built-in stereomicroscope
Model with built-in metallograph
Applications
- Temperature characteristics tests in range from +20°C to +300°C
- Ultra low signal I-V measurements (fA level)
- Various C-V measurements (quasi-static C-V, HF-CV, and RF-CV)
- RF measurements (up to 67 GHz)
- Ultra high-speed I-V measurements
Extended applications
- Probe card support (can support Multisite WLR)
- Probing with submicron accuracy achieved by a built-in metallograph, active vibration isolator, and ultra high-accuracy stage
- High-power device measurements (200A pulse, ±3kV triaxial, ±10kV coaxial)
System configuration examples
Model with built-in metallograph
Equipped with a hot chuck that supports a temperature range from +20°C to +300°C.
Model with built-in high performance stereomicroscope
Equipped with the probe card adapter.
Typical specifications
Item | HMP-800 | HMP‐1200 |
---|---|---|
Wafer Size | ~ φ200 mm | ~ φ300 mm |
X‐Y coarse travel | X:205mm,Y:300mm | X:305mm,Y:400mm |
X‐Y fine travel | XY:13mm/Micro meter head | |
θ travel | coarse ±30°, fine ±2.5° | |
Platen Z axis action | 0 / 0.3 / 10mm | |
0~13mm | 0 to 15 mm | |
Unit dimension(W×D×H)* | 550×650×450mm | 690×780×450mm |
Weight* | 60kg | 80kg |
* Items with asterisk vary depending on system configuration.